Introduction
This manual provides instructions for the safe and proper use of the S-4800 Field Emission Scanning Electron Microscope (SEM).
Application
The S-4800 SEM is designed for observation and evaluation of specimens prepared for SEM observation, utilizing an electron beam accelerated at 500 V to 30 kV.
Caution
Users must operate the instrument carefully, following specified application ranges and safety precautions to avoid potential risks, including X-ray production and eye strain.
Scope of Instruction Manual
This manual covers installation, function, operation, maintenance, and replacement parts for the S-4800 SEM.
Guarantee
The instrument is guaranteed for one year from installation, with exclusions for failures due to improper use, power supply issues, corrosion, and unauthorized modifications.
Manual:
Download: INSTRUCTION MANUAL FOR MODEL S-4800 FIELD EMISSION SCANNING ELECTRON MICROSCOPE
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