Introduction

The SU3800/SU3900 scanning electron microscope is designed for observing and evaluating specimens using an electron beam accelerated at 300 V to 30 kV.

Important Safety Guidelines

Before operating the instrument, read the “IMPORTANT” and “GENERAL SAFETY GUIDELINE” chapters to ensure safety.

Leakage X-Ray Radiation: Ensure safety with sufficient care in operation, and follow cautionary instructions to prevent radiation damage.

Radiation Hazard due to Laser Beam: Observe cautionary instructions to prevent laser radiation harm, and do not attempt to repair or modify the instrument.

Manual:

Download: HITACHI SCANNING ELECTRON MICROSCOPE SU3800/SU3900 INSTRUCTION MANUAL (User’s Operation/Maintenance Edition)

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