Introduction
The SU3800/SU3900 scanning electron microscope is designed for observing and evaluating specimens using an electron beam accelerated at 300 V to 30 kV.
Important Safety Guidelines
Before operating the instrument, read the “IMPORTANT” and “GENERAL SAFETY GUIDELINE” chapters to ensure safety.
Leakage X-Ray Radiation: Ensure safety with sufficient care in operation, and follow cautionary instructions to prevent radiation damage.
Radiation Hazard due to Laser Beam: Observe cautionary instructions to prevent laser radiation harm, and do not attempt to repair or modify the instrument.
Manual:
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