HITACHI Inspire the Next SCANNING ELECTRON MICROSCOPE SU3800/SU3900 INSTRUCTION MANUAL (User’s Operation/Maintenance Edition)

Introduction

The SU3800/SU3900 scanning electron microscope is designed for observing and evaluating specimens using an electron beam accelerated at 300 V to 30 kV.

Important Safety Guidelines

Leakage X-ray radiation from this instrument is 0.1 pSv/hour under actual operating conditions, satisfying the IEC 61010-1 Ed.3.2010 requirement. Cautionary instructions include using the instrument properly, not removing protective parts, and not modifying the instrument to disable safety mechanisms.

Radiation hazard due to laser beam: the Super Multi drive in the PC is equipped with a laser light source, conforming to Class-1 Laser Device Standards. Cautionary instructions include not opening the laser device panel, not making control adjustments, and leaving repairs to authorized service engineers.

Manual:

Download: HITACHI Inspire the Next SCANNING ELECTRON MICROSCOPE SU3800/SU3900 INSTRUCTION MANUAL (User’s Operation/Maintenance Edition)

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