Z04 Series – Standard 4A TRIACs

Category: Electronics, STMicroelectronics Inc, Trigger Devices

Overview

The Z04 series datasheet presents a range of standard 4A TRIACs, designed for general purpose AC switching applications. These semiconductor devices are well-suited for use in applications such as touch light dimmers, fan controllers, and HID lamp ignitors. The series includes TRIACs with various gate current sensitivities, which allows for optimized performance when controlled by microcontrollers.

Main Features

RMS on-state current: 4 Amps
Repetitive peak off-state voltage: Ranges from 600 to 800 Volts
Gate trigger current (IGT) in Quadrant I: Ranges from 3 to 25 mA

Absolute Maximum Ratings

The datasheet provides a comprehensive list of absolute maximum ratings for the Z04 series TRIACs, which is crucial information for engineers designing circuits with these components. It is essential to understand the maximum limits to prevent damage to the TRIACs. The listed parameters and values include:

IT(RMS): Allows for an RMS on-state current of up to 4A at case temperatures of 30°C or ambient temperatures of 25°C. Beyond these conditions, the TRIAC could be subject to thermal failure.

ITSM (Non-repetitive surge peak on-state current): The TRIACs can handle surge currents up to 21A for brief periods when subjected to a full cycle at a starting junction temperature of 25°C and at a frequency of 60 Hz.

t Value for fusing: This rating is critical to understanding how much energy over a particular time can be withstood before the TRIACs will likely fail. For this series, it is given as 2.2 A²s at a pulse width of 10ms.

dI/dt: The critical rate of rise of on-state current that the TRIACs can sustain is 20 A/µs at a pulse width of 20 µs and a maximum junction temperature of 125°C.

IGM (Peak gate current), PG(AV) (Average gate power dissipation), Tstg (Storage junction temperature range), and Tj (Operating junction temperature range): These specify the thresholds for the gate current peak, power dissipation, and operating/storage temperature limits of the TRIAC, which further assist designers in ensuring reliability and longevity of the device.